Signature 3D topography is becoming a new trend in forensic research. It is a powerful method for forensic document examination. The surface to measure for characterizing an entire specimen is often very large. Considering the structure and the signature imprint depth on paper, a relatively good lateral resolution is needed. Therefore, stitching over many images to retrieve the full field of view is necessary.
In this application, a dedicated system and user interface have been developed for the Institute of Forensic Sciences in Shanghai, China. This customized system offers two simultaneous measurement mode: DHM and color intensity images. The benefit of it is to acquire real color information and height information at each pixel, providing a new perspective and dream tool for forensic document examination.