液体表面形貌 Fluid Topography
Fluid Topography on a Substrate
Topography of fluids and soft materials can only be measured with a non-contact, non-damaging method.
Reflectometry Anaylsis software
DHM® Reflectometry Analysis method, in contrary to alternative systems, is a non-scanning method and enables to study dynamic 3D topography of liquids. A representative example is to measure the profile of a drop of Tetraethylenglycol liquid deposed on a Si wafer.
- layer one (TetraEthylene Glycol): thickness 0 nm; uncertainty: 0 nm
- deposition min: -10 nm; deposition max: 10000 nm; increment; 1 nm
The DHM® Reflectometry Analysis software provides an essential solution to observe problems of evaporation, wettability, crystallization, photoresist deposition, etc. on reflective substrates.
